DocumentCode :
2503828
Title :
Process and reliability characteristics of polymer flip chip assemblies utilizing stencil printed thermosets and thermoplastics
Author :
Estes, Richard H.
Author_Institution :
Polymer Flip Chip Corp., Billerica, MA, USA
fYear :
1998
fDate :
28-30 Sep 1998
Firstpage :
229
Lastpage :
239
Abstract :
The implementation of low cost, highly reliable solutions for advanced packaging requirements is the culmination of successfully integrating different technology disciplines into the final product. These include advanced IC design, substrate design, and fabrication, as well as specially formulated materials and processes for production of the flip chip bump interconnect and underfill methodology. Advanced stencil printing of thermoset and thermoplastic pastes for bump formation is perhaps the most critical parameter in the fabrication of solderless flip chip assemblies with high reliability. This discussion in this paper focuses on the stencil print process when conductive thermoset and thermoplastic pastes are processed to produce the bump pattern on wafers and/or substrates. Investigation of the relationships between the stencil type, paste characteristics, and print parameters are made and correlated with resulting bump yield, uniformity and electrical resistance measurements. Long term reliability is discussed with respect to thermoset vs. thermoplastic pastes, uniformity and quality of stencil apertures, and the ability to produce repeatable, uniform bumps on wafers for flip chip assembly. Finally, suggestions are made as to the best methods for achieving high performance flip chip solutions without solder
Keywords :
conducting polymers; electric resistance; encapsulation; filled polymers; flip-chip devices; integrated circuit bonding; integrated circuit packaging; integrated circuit reliability; microassembling; IC design; bump electrical resistance measurements; bump formation; bump pattern; bump uniformity; bump yield; conductive thermoplastic pastes; conductive thermoset pastes; flip chip assembly; flip chip bump interconnect methodology; flip chip bump underfill methodology; high reliability packaging; long term reliability; packaging cost; paste characteristics; polymer flip chip assemblies; print parameters; process characteristics; reliability; reliability characteristics; repeatable uniform bumps; solderless flip chip assemblies; stencil aperture quality; stencil aperture uniformity; stencil print process; stencil printed thermoplastics; stencil printed thermosets; stencil printing; stencil type; substrate design; technology disciplines; thermoplastic pastes; thermoset pastes; Apertures; Assembly; Costs; Electrical resistance measurement; Fabrication; Flip chip; Packaging; Polymers; Printing; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
Conference_Location :
Binghamton, NY
Print_ISBN :
0-7803-4934-2
Type :
conf
DOI :
10.1109/ADHES.1998.742032
Filename :
742032
Link To Document :
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