Title :
Preparation of high quality and tunable band gap hydrogenated amorphous silicon by homogeneous-CVD (HOMOCVD)
Author :
Qian, Z.M. ; Michiel, H. ; Van Ammel, A. ; Nijs, J. ; Mertens, R.
Author_Institution :
Interuniv. Micro-Electron. Centrum, Leuven, Belgium
Abstract :
Good-quality a-Si:H films with tunable bandgap have been prepared in a modified conventional low-pressure chemical vapor deposition reactor by homogeneous-CVD (HOMOCVD). After an extensive growth study, a reasonable growth rate (more than 100 A/min) has been obtained. Scanning and transmission electron microscope, optical and infrared absorption, dark conductivity, and photoconductivity measurements were used to characterize the films. In general, the results confirm the findings of B.A. Scott et al. (1981) concerning the high quality of HOMOCVD material. The optical gap of such films could be varied from 1.6 eV to 2.6 eV, the activation energy of the dark conductivity then going from 0.7 eV to 1.4 eV. The versatility of HOMOCVD opens the possibility for photovoltaic and other applications.
Keywords :
amorphous semiconductors; chemical vapour deposition; electrical conductivity of amorphous semiconductors and insulators; elemental semiconductors; energy gap; hydrogen; optical constants; photoconductivity; scanning electron microscope examination of materials; semiconductor growth; silicon; solar cells; transmission electron microscope examination of materials; 0.7 to 1.4 eV; 1.6 to 2.6 eV; HOMOCVD; activation energy; amorphous Si:H solar cells; dark conductivity; homogeneous-CVD; infrared absorption; optical absorption; optical gap; photoconductivity; scanning electron microscope; semiconductors; transmission electron microscope; tunable bandgap; Amorphous silicon; Chemical vapor deposition; Conductive films; Conductivity; Electron optics; Inductors; Optical films; Optical microscopy; Photonic band gap; Scanning electron microscopy;
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/PVSC.1988.105706