Title :
An X-Ray Irradiation System for Total-Dose Testing of Quartz Resonators
Author :
Palku, Leslie J. ; Truong, Quang T.
fDate :
May 29 1984-June 1 1984
Keywords :
Circuit testing; Frequency measurement; Instruments; Oscillators; Ovens; Semiconductor device modeling; Semiconductor device testing; System testing; Temperature control; Temperature sensors;
Conference_Titel :
38th Annual Symposium on Frequency Control. 1984
Conference_Location :
Philadelphia, Pennsylvania, USA
DOI :
10.1109/FREQ.1984.200737
