• DocumentCode
    2503963
  • Title

    Simulation of a capacitive pressure sensor with VHDL-AMS

  • Author

    Gay, Nicolás A.

  • Author_Institution
    Semicond. & Microsystems Technol. Lab., Dresden Univ. of Technol., Germany
  • fYear
    2003
  • fDate
    8-11 May 2003
  • Firstpage
    7
  • Lastpage
    12
  • Abstract
    In this work a pressure sensor microsystem compatible with the standard CMOS-process is described using the simulation language VHDL-AMS. The system is composed of an array of micromachined membranes and a read-out circuit realized in switched-capacitor technology. The mechanical behavior of the individual membranes was represented using linear and nonlinear models. Three different realizations of the read-out circuit, whose objective is to provide linearization and amplification of the capacitance-pressure characteristic, were tested. Among them, a balanced modulator was designed specifically for this particular application. The employed circuits were validated with the circuit simulator program SPICE and ported to VHDL-AMS. Finally the complete multi-domain microsystem, composed of an array of capacitive membranes, linearization and amplification circuits and an analog-to-digital converter, was simulated under the same framework provided by the simulation language VHDL-AMS. The realizability of complex multi-physics, mixed-signal systems with the help of free simulators was demonstrated.
  • Keywords
    SPICE; capacitive sensors; circuit simulation; hardware description languages; microsensors; pressure sensors; switched capacitor networks; SPICE circuit simulator program; VHDL-AMS simulation language; balanced modulator; capacitance-pressure characteristics; capacitive membrane arrays; capacitive pressure sensor; mechanical behavior; mixed-signal simulation; multidomain microsystem; pressure sensor microsystem; read-out circuit; standard CMOS process; switched-capacitor technology; Biomembranes; CMOS technology; Capacitance-voltage characteristics; Capacitive sensors; Circuit simulation; Circuit testing; Mechanical sensors; SPICE; Sensor phenomena and characterization; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
  • Print_ISBN
    0-7803-8002-9
  • Type

    conf

  • DOI
    10.1109/ISSE.2003.1260473
  • Filename
    1260473