DocumentCode :
2504030
Title :
Development of low cost, low temperature conductive adhesives
Author :
Kang, Sung K. ; Purushothaman, S.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1998
fDate :
28-30 Sep 1998
Firstpage :
287
Abstract :
Summary form only given. Electrically and/or thermally conductive materials comprising metallic filler particles and polymer matrix are actively investigated for replacement of the solder interconnects used for microelectronic applications. Ag-filled epoxy resin materials originally developed for thermal conduction in die attach applications have been candidates for this purpose. However, several limitations have been realized when they are considered for solder interconnect replacement, such as low electrical conductivity, low joint strength, increased contact resistance upon thermal cycling, lack of reworkability, Ag migration, etc. In order to overcome these limitations, a new formulation has been developed based on alternative high conductivity filler particles and tailored polymer resins. The high conductivity filler particles are coated with low melting point nontoxic metals or alloys which can be fused to achieve metallurgical bonding between adjacent particles as well as to a substrate. Specifically, a conductive adhesive made of Sn-coated Cu powder and polyimide-siloxane resin was developed, and its salient properties were reported previously. This material is a good candidate for replacing high temperature solder joints such as controlled collapse chip connection (C4) and solder ball connection (SBC) to a ceramic substrate, but not for assembly on polymeric PCBs. In this paper, we report a new formulation of electrically conductive adhesive materials with coated metal filler, which can be used for low temperature and low cost applications
Keywords :
adhesives; conducting polymers; contact resistance; electrical conductivity; filled polymers; integrated circuit interconnections; integrated circuit packaging; microassembling; Ag; Ag migration; Ag-filled epoxy resin materials; Cu-Sn; Sn-coated Cu powder; assembly; ceramic substrate; coated metal filler; conductive adhesive; contact resistance; controlled collapse chip connection; die attach applications; electrical conductivity; electrically conductive adhesive materials; electrically conductive materials; high conductivity filler particles; high temperature solder joints; joint strength; low cost conductive adhesives; low temperature conductive adhesives; melting point; metallic filler particles; metallurgical bonding; microelectronic applications; nontoxic metal coating; polyimide-siloxane resin; polymer matrix; polymeric PCBs; reworkability; solder ball connection; solder interconnect replacement; tailored polymer resins; thermal conduction; thermal cycling; thermally conductive materials; Conducting materials; Conductive adhesives; Costs; Inorganic materials; Microelectronics; Polymers; Resins; Temperature; Thermal conductivity; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on
Conference_Location :
Binghamton, NY
Print_ISBN :
0-7803-4934-2
Type :
conf
DOI :
10.1109/ADHES.1998.742042
Filename :
742042
Link To Document :
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