Nonlinearity of thick film resistors in comparison with Zigalski theory

The paper is focused on study of dependence of nonlinearity of C-V characteristic of thick film resistors. Dependence of third harmonics voltage on width or length was investigated. Two sets of resistors with different lengths and widths were measured at different conditions - at same supply voltage U_l at same electrical load P, at same current I and at same current density J for all set of resistors. The relationship between voltage of third harmonics and width or length was found with using approximation of measured dependences. Most of functions used for approximation trace curve of dependence close. Linear or power functions were used for approximation of measured dependences. The dependences obtained from experimental results were compared with theoretical relationships. Theoretical equation for third harmonics voltage was derived from Zigalski theory. Some relation between theoretical dependences and experimental result was found.