• DocumentCode
    2504242
  • Title

    Overcomplete expansions and robustness

  • Author

    Cvetkovic, Zoran ; Vetterli, Martin

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA
  • fYear
    1996
  • fDate
    18-21 Jun 1996
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    The motivation for the development of the theory of time-frequency and time-scale expansions towards wavelet and Weyl-Heisenberg frames stems mainly from the design freedom which is usually attained with overcomplete expansions. Also, it has been observed that for a given accuracy of representation overcomplete expansions allow for a progressively coarser quantization provided that the redundancy is increased. Increased robustness of overcomplete expansions compared to nonredundant ones is manifested for two primary sources of degradation, white additive noise and quantization. Reconstruction from expansion coefficients adulterated by an additive noise reduces the noise effect by a factor proportional to the expansion redundancy. We conjecture that the effect of the quantization error can be reduced inversely to the square of the expansion redundancy and prove that result in two particular cases, Weyl-Heisenberg expansions and oversampled A/D conversion
  • Keywords
    quantisation (signal); signal reconstruction; signal representation; signal sampling; time-frequency analysis; wavelet transforms; white noise; Weyl-Heisenberg expansions; Weyl-Heisenberg frames; expansion coefficients; expansion redundancy; overcomplete expansions; oversampled A/D conversion; quantization error; robustness; signal reconstruction; signal representation; time-frequency expansion; time-scale expansion; wavelets; white additive noise; Additive noise; Degradation; Frequency; Image reconstruction; Noise reduction; Noise robustness; Quantization; Redundancy; Systems engineering and theory; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Time-Frequency and Time-Scale Analysis, 1996., Proceedings of the IEEE-SP International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-3512-0
  • Type

    conf

  • DOI
    10.1109/TFSA.1996.547479
  • Filename
    547479