• DocumentCode
    2504351
  • Title

    Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion

  • Author

    Trummer, Michael ; Munkelt, Christoph ; Denzler, Joachim

  • Author_Institution
    Dept. of Comput. Vision, Friedrich-Schiller Univ. of Jena, Jena, Germany
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    1642
  • Lastpage
    1645
  • Abstract
    Next-best-view (NBV) planning is an important aspect for three-dimensional (3D) reconstruction within controlled environments, such as a camera mounted on a robotic arm. NBV methods aim at a purposive 3D reconstruction sustaining predefined goals and limitations. Up to now, literature mainly presents NBV methods for range sensors, model-based approaches or algorithms that address the reconstruction of a finite set of primitives. For this work, we use an intensity camera without active illumination. We present a novel combined online approach comprising feature tracking, 3D reconstruction, and NBV planning that addresses arbitrary unknown objects. In particular we focus on accuracy optimization based on the reconstruction uncertainty. To this end we introduce an extension of the statistical E-criterion to model directional uncertainty, and we present a closed-form, optimal solution to this NBV planning problem. Our experimental evaluation demonstrates the effectivity of our approach using an absolute error measure.
  • Keywords
    feature extraction; image reconstruction; statistical analysis; 3D reconstruction; absolute error measure; accuracy optimization; extended E-criterion; feature tracking; model-based approaches; online next-best-view planning; robotic arm; three-dimensional reconstruction; Accuracy; Cameras; Image reconstruction; Lead; Planning; Sensors; Three dimensional displays; 3D reconstruction; NBV planning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.406
  • Filename
    5597268