Title :
Active cancellation of mutual inducatance in split-coil thin-film heads
Author :
Stupp, S.E. ; Lovelace, G.
Author_Institution :
Quantum Corp.
Keywords :
Degradation; Etching; Fabrication; Inductance; Ion beams; Magnetic heads; Manufacturing; Protection; Spin valves; Transistors;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742083