• DocumentCode
    2504799
  • Title

    SAR imaging using fully random bandlimited signals

  • Author

    Garmatyuk, D.S. ; Narayanan, R.M.

  • Author_Institution
    Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
  • Volume
    4
  • fYear
    2000
  • fDate
    16-21 July 2000
  • Firstpage
    1948
  • Abstract
    A coherent ultrawideband (UWB) random noise synthetic aperture radar (SAR) has been developed and tested at the University of Nebraska. It has been experimentally shown that this type of radar is capable of extracting the phase and the amplitude of the backscattered signal, thus enabling us to create target profiles in the frequency domain. The use of fully random waveforms (bandlimited noise) as the transmit signal is analyzed. A UWB signal model is developed and radar signal processing is simulated to yield the statistical characteristics of image formation using stochastic waveforms. The influence of the UWB signal characteristics on the image quality is estimated and represented graphically.
  • Keywords
    Gaussian distribution; backscatter; bandlimited signals; feature extraction; frequency-domain analysis; radar imaging; random noise; statistical analysis; stochastic processes; synthetic aperture radar; Gaussian-distributed amplitude; SAR imaging; UWB signal characteristics; UWB signal model; University of Nebraska; amplitude extraction; backscattered signal; bandlimited noise; coherent ultrawideband random noise SAR; experiment; frequency domain; image formation; image quality; phase extraction; radar signal processing; random bandlimited signals; random waveforms; statistical characteristics; stochastic waveforms; synthetic aperture radar; target profiles; transmit signal; Frequency domain analysis; Radar imaging; Radar polarimetry; Radar signal processing; Signal analysis; Signal processing; Stochastic resonance; Synthetic aperture radar; Testing; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2000. IEEE
  • Conference_Location
    Salt Lake City, UT, USA
  • Print_ISBN
    0-7803-6369-8
  • Type

    conf

  • DOI
    10.1109/APS.2000.874872
  • Filename
    874872