DocumentCode :
2505165
Title :
Monitoring of large-area solar cell homogeneity by local irradiation
Author :
Benda, V. ; Asresahegn, A.L. ; Radil, J.
Author_Institution :
Dept. of Electrotechnol., Czech Tech. Univ. in Prague, Czech Republic
fYear :
2003
fDate :
8-11 May 2003
Firstpage :
295
Lastpage :
297
Abstract :
The paper refers about a possibility to check carrier lifetime distribution over the area of power (large-area) solar cells. The carrier lifetime in volume of the cell body can be evaluated using local irradiation of the surface of large-area solar cells with a laser diode (λ = 820 nm) from measured values of open circuit voltage Voc. The method can give information about recombination centres distribution in large-area solar cells. From Voc distribution, also position and extent of local defects can also be determined. Solar cell diagnostic methods can be used to investigate the influence of technology on characteristics of solar cells, with the aim of increasing efficiency and reliability of solar cells.
Keywords :
carrier lifetime; measurement by laser beam; radiation effects; semiconductor lasers; solar cells; 820 nm; carrier lifetime distribution; diagnostic methods; large-area solar cells; laser diode; local defects; local irradiation; open circuit voltage method; recombination centres distribution; solar cell homogeneity; Charge carrier lifetime; Circuit simulation; Current density; Diode lasers; Equivalent circuits; Monitoring; Photovoltaic cells; Solar power generation; Spontaneous emission; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
Print_ISBN :
0-7803-8002-9
Type :
conf
DOI :
10.1109/ISSE.2003.1260535
Filename :
1260535
Link To Document :
بازگشت