DocumentCode :
2505241
Title :
Material quality and design optimization for high efficiency GaAs solar cells
Author :
Ringel, S.A. ; Rohatgi, A.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1988
fDate :
1988
Firstpage :
666
Abstract :
A methodology is developed to determine minority carrier lifetime and recombination velocity in high-efficiency GaAs p/n heteroface solar cells. A combination of measurements and modeling is used to demonstrate that a base lifetime of 8 ns and a heteroface recombination velocity of 1.25*105 cm/s are necessary to simulate the spectral response, cell data, and leakage current in a 21.2% efficient GaAs cell. Optimization of the p/n heteroface structure shows that AM1.5 one-sun efficiencies of approximately 25% are achievable from a thin base/buffer design with a base lifetime of only 15 ns and a well-passivated back surface. In addition, it is shown that the doping dependence of the Shockley-Read-Hall lifetime is an important consideration in GaAs device modeling, especially if a shallow level ( approximately Et=0.2 eV) limits the bulk lifetime.
Keywords :
III-V semiconductors; carrier lifetime; electron-hole recombination; gallium arsenide; minority carriers; p-n heterojunctions; solar cells; 21.2 percent; 25 percent; GaAs solar cells; Shockley-Read-Hall lifetime; base lifetime; bulk lifetime; design optimization; doping dependence; high efficiency; leakage current; minority carrier lifetime; p/n heteroface solar cells; passivated back surface; recombination velocity; semiconductor; spectral response; thin base/buffer design; Absorption; Charge carrier lifetime; Current measurement; Design optimization; Doping; Equations; Gallium arsenide; Leakage current; Life testing; Photovoltaic cells; Q measurement; Read only memory; Semiconductor process modeling; Tellurium; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
Type :
conf
DOI :
10.1109/PVSC.1988.105787
Filename :
105787
Link To Document :
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