DocumentCode :
2505357
Title :
A multi process reactor for low temperature TFT fabrication
Author :
Quinn, Li ; Baine, PT ; Mitchell, SJN ; Armstrong, BM. ; Gamble, HS
Author_Institution :
Dept. of Electr. & Electron. Eng., Queen´´s Univ., Belfast, UK
fYear :
1994
fDate :
12-14 Apr 1994
Firstpage :
589
Abstract :
A single chamber multi-process reactor has been developed specifically for Thin Film Transistor (TFT) technology. A variety of processes can be performed sequentially in the system with minimum delay between process steps. Processes available at the moment include CVD silicon, plasma enhanced silicon nitride deposition and plasma etching/substrate cleaning. The layers produced to date and the processes available with this machine have been characterised. The individual processes have yielded results comparable to those of single step reactors. All processes developed with this reactor have been limited to 620°C to ensure compatibility with Corning 7133 glass substrates. Polysilicon TFT´s, with silicon nitride gate dielectrics, have been fabricated with mobilities of 30 cm2/Vsec and on/off current ratios of >106. The system is best exploited when multi-layer structures are required with minimal contamination. SIMS results of the interface properties are shown for layers deposited sequentially
Keywords :
carrier mobility; chemical vapour deposition; plasma CVD; secondary ion mass spectra; semiconductor technology; sputter etching; surface cleaning; thin film transistors; 620 C; CVD silicon; Corning 7133 glass substrates; SIMS; Si-SiN; Thin Film Transistor technology; contamination; interface properties; low temperature TFT fabrication; mobilities; multi-layer structures; on/off current ratios; plasma enhanced silicon nitride deposition; plasma etching/substrate cleaning; polysilicon TFTs; sequential layer deposition; silicon nitride gate dielectrics; single chamber multi-process reactor; Cleaning; Delay systems; Dielectric substrates; Etching; Fabrication; Inductors; Plasma applications; Plasma temperature; Silicon; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference, 1994. Proceedings., 7th Mediterranean
Conference_Location :
Antalya
Print_ISBN :
0-7803-1772-6
Type :
conf
DOI :
10.1109/MELCON.1994.381023
Filename :
381023
Link To Document :
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