Title :
An extended registration framework for the triple registration of IBZM SPECT, DATSCAN SPECT and MRI brain images to support the evaluation of brain dopamine receptor scintigraphies
Author :
Papp, Laszlo ; Zsoter, Norbert ; Bandi, Peter ; Barna, Sandor ; Luetzen, Ulf
Author_Institution :
Mediso Med. Imaging Syst. Ltd., Budapest, Hungary
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
An extended registration model is presented to register medical image triples acquired for brain dopamine receptor scintigraphies. The model operates with rigid and nonlinear transformations in parallel, where all transformation parameters are optimized by one optimization method. The concept of the transformation-sampling-similarity measurement minimizes the memory usage of a real implementation. A partial-fine sampling method is proposed to decrease the processing time of the registration. Real medical data was collected to compare our method with well-known prior ones. The first tests show that the model outperforms the classic registration methods in both speed and accuracy.
Keywords :
biomedical MRI; brain; image registration; medical image processing; neurophysiology; optimisation; radioisotope imaging; single photon emission computed tomography; DATSCAN SPECT brain images; IBZM SPECT brain images; MRI brain images; brain dopamine receptor scintigraphies; extended registration framework; medical image triples; nonlinear transformations; optimization method; partial fine sampling method; registration processing time; rigid transformations; transformation parameters; transformation-sampling-similarity measurement; Biomedical imaging; Conferences; Dementia; Magnetic resonance imaging; Optimization methods; Single photon emission computed tomography; Brain; Computer Simulation; Evaluation Studies as Topic; Humans; Image Processing, Computer-Assisted; Magnetic Resonance Imaging; Receptors, Dopamine; Tomography, Emission-Computed, Single-Photon;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091979