Title :
A novel method to rapidly determine the key properties of thermoelectric devices
Author :
En-Ting Chu ; Heng-Chieh Chien ; Huey-Lin Hsieh ; Jing-Yi Huang ; Chun-Kai Liu ; Da-Jeng Yao
Author_Institution :
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fDate :
May 30 2012-June 1 2012
Abstract :
This article presents a novel method to determine the representative properties of a thermoelectric module (TEM). The method, by applying a constant current to a thermoelectric module then measuring the module´s transient voltage and both sides temperatures, could rapidly determine the module´s effective properties. The properties include Seebeck coefficient (S), electrical resistance (R), and thermal conductance (K). A commercial module, Altec1091, had been measured in this study, the test data shows a good agreement with previous literatures results.
Keywords :
thermoelectric devices; Seebeck coefficient; TEM; electrical resistance; module transient voltage measurement; test data; thermal conductance; thermoelectric devices; thermoelectric module; Current measurement; Electrical resistance measurement; Resistance; Temperature measurement; Thermal conductivity; Transient analysis; Voltage measurement; Seebeck coefficient; electrical resistance; measurement; thermal conductivity; thermoelectric module;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231418