Title :
A 2D 3D registration with low dose radiographic system for in vivo kinematic studies
Author :
Jerbi, T. ; Burdin, V. ; Stindel, E. ; Roux, C.
Author_Institution :
Inst. Telecom/Telecom Bretagne, Cesson-Sévigné, France
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
The knowledge of the poses and the positions of the knee bones and prostheses is of a great interest in the orthopedic and biomechanical applications. In this context, we use an ultra low dose bi-planar radiographic system called EOS to acquire two radiographs of the studied bones in each position. In this paper, we develop a new method for 2D 3D registration based on the frequency domain to determine the poses and the positions during quasi static motion analysis for healthy and prosthetic knees. Data of two healthy knees and four knees with unicompartimental prosthesis performing three different poses (full extension, 30° and 60° of flexion) were used in this work. The results we obtained are in concordance with the clinical accuracy and with the accuracy reported in other previous studies.
Keywords :
biomechanics; diagnostic radiography; image registration; medical image processing; orthopaedics; position measurement; prosthetics; 2D-3D registration; biomechanical applications; bone radiographs; frequency domain; healthy knees; in vivo kinematic studies; knee bone pose; knee bone position; knee prostheses pose; knee prostheses position; low dose radiographic system; orthopedic applications; prosthetic knees; quasistatic motion analysis; ultralow dose biplanar radiographic system; unicompartimental prosthesis; Bones; Earth Observing System; Frequency domain analysis; Joints; Prosthetics; Radiography; Three dimensional displays; 2D 3D registration; frequency domain; knee joint; low dose radiography; unicompartimental prosthesis; Algorithms; Artificial Limbs; Biomechanics; Bone and Bones; Dose-Response Relationship, Radiation; Humans; Imaging, Three-Dimensional; Rotation;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091990