DocumentCode :
2505917
Title :
Tooling for wafer and photomask cleaning and surface preparation using a dry, laser-assisted technology
Author :
Engelsberg, A.C. ; Lizotte, T.E. ; Ohar, O.P. ; O´Keefe, T.R.
Author_Institution :
Radiance Services Co., Bethesda, MD, USA
fYear :
1996
fDate :
14-16 Oct 1996
Firstpage :
223
Lastpage :
231
Abstract :
The semiconductor industry is entering into an era of global competitiveness that needs to factor in the economics of capital and operational costs along with environmental compliance to operate profitable fabricators. Innovative manufacturing technologies will be required to meet the technological and cost requirements. This paper introduces a new technology for cleaning and surface preparation called the Radiance Process. It operates under quantum mechanical principles using only photons of light and a laminar flowing inert gas, which makes it environmentally friendly. The technology has been demonstrated to remove the following types of contamination in a one-step process that does not damage the underlying surface: Particles (organic, inorganic and metallic), metallic ions, oxides, and thin films (organic and inorganic). With its inherent simplicity, flexibility, and modular tool design, the technology can accommodate stand-alone and cluster modules as well as multiple substrate dimensions. Projected cost-of-ownership figures indicate that this technology is significantly less expensive than current wet-chemical-based processes because infrastructure for water and chemical usage and disposal is not required. This paper describes our technology, its developmental results, tool design and projected cost-of-ownership figures
Keywords :
economics; laser materials processing; masks; semiconductor device manufacture; semiconductor technology; surface cleaning; Radiance Process; cleaning; cluster module; contamination; cost-of-ownership; dry laser-assisted technology; environmental factors; multiple substrate; photomask; quantum mechanics; semiconductor manufacturing; stand-alone module; surface preparation; tool design; wafer; Chemical technology; Costs; Electronics industry; Environmental economics; Green cleaning; Quantum mechanics; Semiconductor device manufacture; Substrates; Surface contamination; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3642-9
Type :
conf
DOI :
10.1109/IEMT.1996.559735
Filename :
559735
Link To Document :
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