• DocumentCode
    2505926
  • Title

    Maximum entropy fracture model and its use for predicting cyclic hysteresis in solder alloys

  • Author

    Tucker, J.P. ; Chan, D.K. ; Subbarayan, G. ; Handwerker, C.A.

  • Author_Institution
    Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    207
  • Lastpage
    215
  • Abstract
    Appropriate constitutive, damage accumulation and fracture models are critical to accurate life predictions. In our recent research we developed the maximum entropy fracture model, a thermodynamically consistent and information theory inspired (non-empirical) damage accumulation theory for ductile solids, validated on both area array and peripheral array packages. The model uses a single damage accumulation parameter to relate the probability of fracture to accumulated entropic dissipation. We demonstrate the ability of the Anand model and the above mentioned damage accumulation model to non-empirically predict the softening phenomena during cyclic fatigue testing of Sn3.0Ag0.5Cu solder alloy. A custom-built microscale mechanical tester capable of submicron displacement resolution was utilized to carryout isothermal cycling fatigue tests on specially designed assemblies. The resultant relationship between load drop and accumulated inelastic dissipation was used to extract the temperature and geometry-independent damage accumulation parameter of the maximum entropy fracture model for each alloy. The damage accumulation relationship is input into the Anand viscoplastic constitutive model, allowing prediction of the stress-strain hysteresis and cyclic load drop. This approach allows for a non-empirical prediction of both constitutive and fracture behavior of packages of different geometries under thermo-mechanical fatigue.
  • Keywords
    copper alloys; entropy; fatigue testing; fracture; mechanical testing; silver alloys; solders; stress-strain relations; tin alloys; Anand model; Anand viscoplastic constitutive model; SnAgCu; accumulated inelastic dissipation; area array package; constitutive behavior prediction; custom-built microscale mechanical tester; cyclic fatigue testing; cyclic hysteresis prediction; cyclic load drop; damage accumulation relationship; damage accumulation theory; ductile solid; entropic dissipation; fracture behavior prediction; fracture probability; geometry-independent damage accumulation parameter; information theory; isothermal cycling fatigue testing; life prediction; maximum entropy fracture model; peripheral array package; resultant relationship; solder alloy; stress-strain hysteresis prediction; submicron displacement resolution; temperature extraction; thermo-mechanical fatigue; Abstracts; Deformable models; Entropy; Facsimile; Metals; Strain; Thermomechanical processes; Anand model; SnAgCu solder; constitutive behavior; damage; fatigue fracture; maximum entropy fracture model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231432
  • Filename
    6231432