DocumentCode :
2505979
Title :
Characteristics of Natural, Swept Natural, and Cultured X- and Z-Growth Quartz Material in High Temperature, High Stress Applications
Author :
Kusters, John A. ; Kaitz, Gwen S.
fYear :
1985
fDate :
29-31 May 1985
Firstpage :
223
Lastpage :
229
Keywords :
Counting circuits; Crystalline materials; Crystallization; Frequency synthesizers; Pressure gauges; Pressure measurement; Stress; Temperature distribution; Testing; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
39th Annual Symposium on Frequency Control. 1985
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1985.200848
Filename :
1537788
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2505979
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