DocumentCode :
2505989
Title :
The Growth of High Quality Quartz in Commercial Autoclaves
Author :
Armington, Alton F. ; Balascio, Joseph F.
fYear :
1985
fDate :
29-31 May 1985
Firstpage :
230
Lastpage :
233
Keywords :
Aluminum; Atomic measurements; Etching; Frequency; Impurities; Mass spectroscopy; Paramagnetic resonance; Plasma measurements; Plasma temperature; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
39th Annual Symposium on Frequency Control. 1985
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1985.200849
Filename :
1537789
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2505989
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