DocumentCode :
2506027
Title :
Ultra-reliable packaging for silicon-on-silicon WSI
Author :
Hagge, J.K.
Author_Institution :
Rockwell Int. Corp., Cedar Rapids, IA
fYear :
1988
fDate :
9-11 May 1988
Firstpage :
282
Lastpage :
292
Abstract :
The advantages of using silicon instead of conventional ceramic as the substrate material in silicon-on-silicon wafer-scale integration (WSI) packaging are discussed, and the status of this technology at other organizations, as reflected in the literature, is reviewed. It is argued that there exists an untapped potential for significant reliability improvements by switching to packages specifically designed for silicon substrates. Several packaging approaches are reviewed, and results are presented for the fatigue life and thermal performance of silicon substrates
Keywords :
VLSI; hybrid integrated circuits; packaging; reliability; silicon; Si on Si WSI; Si substrates; fatigue life; packaging; packaging approaches; reliability improvements; substrate material; thermal performance; wafer-scale integration; Ceramics; Fatigue; Packaging; Silicon; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ECC.1988.12606
Filename :
12606
Link To Document :
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