DocumentCode :
2506045
Title :
Effect of reflow process on glass transition temperature of printed circuit board laminates
Author :
Lall, Pradeep ; Narayan, Vikalp ; Suhling, Jeff ; Blanche, Jim ; Strickland, Mark
Author_Institution :
Dept. of Mech. Eng., Auburn Univ., Auburn, AL, USA
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
261
Lastpage :
268
Abstract :
The effect of temperature exposure encountered both during assembly and in fielded products, has a known influence on glass transition temperature of printed-circuit board (PCB) laminate materials. Printed circuit board laminates such as FR4 are composites of epoxy resin with woven fiberglass reinforcement. Interaction between manufacturing process variables that impact the changes in glass transition temperature (Tg) has been studied. The laminates studied have been broadly classified into high-Tg, and mid-Tg laminates. Different sets of reflow profiles were created by varying the process variables including, time above liquidus, peak temperature, ramp rate and cooling rate. The effect of multiple reflows encountered in normal assembly or board rework has been studied by exposing the assemblies to multiple reflows between 2×-6×. Changes to the glass transition temperature have been classified by measurement of the glass transition temperature were measured via Thermo Mechanical Analysis (TMA). Statistical analysis of the variables has been used to determine the statistical significance of the measured changes for large populations.
Keywords :
assembling; glass transition; laminates; printed circuits; resins; statistical analysis; thermomechanical treatment; TMA; assembly; epoxy resin; glass transition temperature; printed circuit board laminates; reflow process; statistical analysis; temperature exposure; thermo mechanical analysis; woven fiberglass reinforcement; Assembly; Glass; Laminates; Mechanical variables measurement; Printed circuits; Temperature distribution; Temperature measurement; glass transition temperature; leadfree; number of reflows; peak temperature; time above liquidus;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231439
Filename :
6231439
Link To Document :
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