• DocumentCode
    2506086
  • Title

    Mechanical and thermal response of compliant Thermal Interface Materials under cyclic loading

  • Author

    Chavali, S. ; Singh, Y. ; Subbarayan, G. ; Garimella, S.

  • Author_Institution
    Sch. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    282
  • Lastpage
    289
  • Abstract
    Compliant Thermal Interface Materials (TIMs) or Gap pads are an important material set in many applications including automotive electronics. Commercially available Compliant TIMs exhibit significant time-dependent deformation under compression limiting their utility. While these materials are expected to enhance thermal transport by filling gaps, their (often viscoelastic) mechanical behavior is not well understood. Present work is aimed at the development of test procedures to identify time-dependent viscoelastic behavior of compliant TIMs and to correlate the mechanical response of the materials to experimentally measured effective thermal conductivity. Towards this end, a commercially available compliant TIM using dynamic mechanical tests on a specially constructed low-load mechanical tester at 25°C and 75°C. Sinusoidal displacement profiles are applied at frequencies ranging from 0.1/hr to 10/hr. The change in response as a result of cyclic loading, or softening due to cycling, is quantified over a period of 500 cycles. The eventual goal is to study the stresses transmitted to the solder joints through the TIMs as a result of applied pressures during heatsink assembly.
  • Keywords
    automotive electronics; heat sinks; solders; thermal conductivity; thermal management (packaging); viscoelasticity; TIM; automotive electronics; compliant thermal interface material; cyclic loading; dynamic mechanical test; gap pads; heat sink assembly; low-load mechanical tester; mechanical response; sinusoidal displacement; solder joints; temperature 25 C; temperature 75 C; thermal conductivity; thermal response; thermal transport; time-dependent deformation; time-dependent viscoelastic behavior; Conductivity; Loading; Materials; Strain; Stress; Temperature measurement; Thermal conductivity; Mechanical Behavior; Viscoelastic; dynamic mechanical tests; thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231441
  • Filename
    6231441