The high frequency behavior of electrooptic Kerr modulators for voltage measurement applications

The electrooptic Kerr effect was the first nonlinear optical phenomenon to be discovered. Nowadays, one of its most important applications lies in the field of high-voltage measurements, especially in the concerning to rapidly varying high-voltage transient electrical signals. This paper is a contribution to the latter field. The issue we address focuses on the analysis of the behavior of Kerr measuring devices in response to the high frequency spectral components of the voltage signal under measurement, which, we show, may appreciably differ from the usual, well-known, low frequency behavior