Efficient statistical analysis and diagnosis of high speed source synchronous interfaces

Author

Matoglu, Erdem ; Swaminathan, Madhavan ; Pham, Nam ; De Araujo, Daniel N. ; Cases, Moises

Author_Institution

Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2002

fDate

21-23 Oct. 2002

Firstpage

223

Lastpage

226

Abstract

The jitter and voltage margin of a source synchronous memory bus has been analyzed under various physical and operational conditions. Using sensitivity functions derived through linearly independent experiments, the statistical distribution of the performance has been computed. The sensitivity functions have also been utilized as a diagnosis tool to estimate the design parameters required to meet the performance specifications.

Keywords

circuit analysis computing; distributed memory systems; jitter; sensitivity analysis; statistical analysis; system buses; design parameters estimation; diagnosis tool; high speed source synchronous interfaces; jitter; linearly independent experiments; operational conditions; performance specifications; physical conditions; sensitivity functions; source synchronous memory bus; statistical analysis; statistical diagnosis; statistical performance distribution; voltage margin; Analytical models; Connectors; Dielectric measurements; Distributed computing; Jitter; Parameter estimation; Statistical analysis; Statistical distributions; Switching circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on

Conference_Location

Monterey, CA, USA

Print_ISBN

0-7803-7451-7

Type

conf

DOI

10.1109/EPEP.2002.1057919

Filename

1057919