Title :
Design and modeling of a 3.2 Gbps/pair memory channel
Author :
Yuan, Chuck ; Beyene, Wendemagegnehu ; Cheng, Newton ; Shi, Hao
Author_Institution :
Rambus Inc., Los Altos, CA, USA
Abstract :
With the rapid advance of silicon process technology, it is now possible to design I/O circuits that operate at multi-gigabit data rates. Rambus´s next generation memory interface technology, code-named Yellowstone, utilizes bi-directional low-swing Differential Rambus Signaling Level (DRSL) with a data transfer rate starting at 3.2 Gbps/pair and scalable to 6.4 Gbps/pair. This paper describes the design and modeling methodology used to develop the Yellowstone memory channel with conventional interconnect technologies. First, the advantages of point-to-point differential signaling are discussed. Then, the design issues associated with low-cost conventional printed circuit boards (PCBs) and packages are described. This is followed by a discussion of the modeling issues associated with high data-rate channel design. A design and modeling methodology is proposed to ensure the robust operation of the Yellowstone memory channel. Finally, to illustrate the validity of the proposed modeling methodology, channel models are correlated with actual hardware at both component and system level in both time and frequency domains.
Keywords :
digital circuits; digital storage; modelling; packaging; printed circuit design; 3.2 Gbit/s; I/O circuits; PCBs; Yellowstone memory channel; bi-directional low-swing DRSL; channel models; design methodology; differential Rambus signaling level; high data-rate channel design; interconnect technologies; memory interface technology; modeling methodology; multi-gigabit data rates; packages; point-to-point differential signaling; printed circuit boards; Bidirectional control; Design methodology; Frequency domain analysis; Hardware; Integrated circuit interconnections; Packaging; Printed circuits; Random access memory; Robustness; Silicon;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057920