Outage probability and error rates of switched diversity systems in Hoyt fading channel

Author

Chandra, Aniruddha ; Bose, Chayanika ; Bose, Manas Kr

Author_Institution

ECE Dept., NIT Durgapur, Durgapur, India

fYear

2010

fDate

17-19 Dec. 2010

Firstpage

1

Lastpage

3

Abstract

Simple closed-form expressions of outage probability and moment generating function (MGF) are found for a switch and examine combiner (SEC) operating over independent and identically distributed (IID) Hoyt fading channel. Next, using the derived MGF, symbol error probability (SEP) of different M-ary modulation schemes are calculated. In addition, an analytic framework is presented for calculation of optimum switching threshold that ensures minimum outage probability or minimum SEP. The analysis is quite general in the sense that it covers switch and stay combiner (SSC) and Rayleigh fading as special cases.

Keywords

Rayleigh channels; diversity reception; error statistics; modulation; IID Hoyt fading channel; M-ary modulation schemes; MGF; Rayleigh fading; SEC; closed-form expressions; error rates; independent-and-identically distributed channel; moment generating function; optimum switching threshold; outage probability; switch-and-examine combiner; switched diversity systems; symbol error probability; Diversity reception; Modulation; Probability; Rayleigh channels; Signal to noise ratio; Switches; Hoyt fading; MGF; SEC; SEP; optimum threshold; outage probability;

fLanguage

English

Publisher

ieee

Conference_Titel

India Conference (INDICON), 2010 Annual IEEE

Conference_Location

Kolkata

Print_ISBN

978-1-4244-9072-1

Type

conf

DOI

10.1109/INDCON.2010.5712609

Filename

5712609