• DocumentCode
    2506416
  • Title

    Improving the thermomechanical behavior of lead free solder joints by controlling the microstructure

  • Author

    Arfaei, Babak ; Wentlent, L. ; Joshi, S. ; Alazzam, Azmi ; Tashtoush, T. ; Halaweh, M. ; Chivukula, S. ; Yin, Lingzhi ; Meilunas, Mecislavas ; Cotts, Eric ; Borgesen, P.

  • Author_Institution
    Dept. of Syst. Sci. & Ind. Eng., Binghamton Univ., New York, NY, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    392
  • Lastpage
    398
  • Abstract
    Effects of solder alloy, volume and pad finishes on various aspects of microstructure and the corresponding thermomechanical properties of SnAgCu solder joints were investigated. Particular attention was focused on the behavior of solder joints with interlaced Sn grain morphologies. Crossed polarizer microscopy and scanning electron microscopy (SEM) were used to characterize Sn grain structures. Precipitate sizes and distributions were measured using backscattered scanning electron microscopy and quantified using image analysis software. Mechanical properties including hardness and indentation creep were measured. Results show that the amount and frequency of interlacing increased as the joint size decreased, as the amount of Ag in the solder increased, and if the joint was reflowed on ENIG substrates. The interlaced structure was harder and more creep resistant compared to the common beach ball morphology. Image analysis results showed this to be related to much higher densities of secondary precipitates in the interlaced regions. A mechanistic understanding of the microstructure is discussed and recommendations are made as to the design of more reliable solder joints.
  • Keywords
    copper alloys; creep; crystal microstructure; hardness; indentation; scanning electron microscopy; silver alloys; solders; thermomechanical treatment; tin alloys; ENIG substrate; SnAgCu; backscattered scanning electron microscopy; creep resistant; crossed polarizer microscopy; grain morphology; grain structure; hardness; image analysis software; indentation creep; interlaced structure; lead free solder joint; microstructure; scanning electron microscopy; secondary precipitate; thermomechanical property; Joints; Microstructure; Morphology; Scanning electron microscopy; Soldering; Tin; Lead Free Solders; Microstructure; Reliability; Sn Grain Morphology; Solidification Temperature; Thermomechanical Properties; Twinning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231456
  • Filename
    6231456