DocumentCode
2506416
Title
Improving the thermomechanical behavior of lead free solder joints by controlling the microstructure
Author
Arfaei, Babak ; Wentlent, L. ; Joshi, S. ; Alazzam, Azmi ; Tashtoush, T. ; Halaweh, M. ; Chivukula, S. ; Yin, Lingzhi ; Meilunas, Mecislavas ; Cotts, Eric ; Borgesen, P.
Author_Institution
Dept. of Syst. Sci. & Ind. Eng., Binghamton Univ., New York, NY, USA
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
392
Lastpage
398
Abstract
Effects of solder alloy, volume and pad finishes on various aspects of microstructure and the corresponding thermomechanical properties of SnAgCu solder joints were investigated. Particular attention was focused on the behavior of solder joints with interlaced Sn grain morphologies. Crossed polarizer microscopy and scanning electron microscopy (SEM) were used to characterize Sn grain structures. Precipitate sizes and distributions were measured using backscattered scanning electron microscopy and quantified using image analysis software. Mechanical properties including hardness and indentation creep were measured. Results show that the amount and frequency of interlacing increased as the joint size decreased, as the amount of Ag in the solder increased, and if the joint was reflowed on ENIG substrates. The interlaced structure was harder and more creep resistant compared to the common beach ball morphology. Image analysis results showed this to be related to much higher densities of secondary precipitates in the interlaced regions. A mechanistic understanding of the microstructure is discussed and recommendations are made as to the design of more reliable solder joints.
Keywords
copper alloys; creep; crystal microstructure; hardness; indentation; scanning electron microscopy; silver alloys; solders; thermomechanical treatment; tin alloys; ENIG substrate; SnAgCu; backscattered scanning electron microscopy; creep resistant; crossed polarizer microscopy; grain morphology; grain structure; hardness; image analysis software; indentation creep; interlaced structure; lead free solder joint; microstructure; scanning electron microscopy; secondary precipitate; thermomechanical property; Joints; Microstructure; Morphology; Scanning electron microscopy; Soldering; Tin; Lead Free Solders; Microstructure; Reliability; Sn Grain Morphology; Solidification Temperature; Thermomechanical Properties; Twinning;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231456
Filename
6231456
Link To Document