Accuracy of dielectric constant measurement using the full-sheet-resonance technique IPC-TM-650 2.5.5.6

Author

Deutsch, A. ; Huber, A. ; Kopcsay, G.V. ; Rubin, B.J. ; Hemedinger, R. ; Care, D. ; Becke, W. ; Winkel, T.-M. ; Chamberlin, B.

Author_Institution

IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA

fYear

2002

fDate

21-23 Oct. 2002

Firstpage

311

Lastpage

314

Abstract

The accuracy limitations of the full-sheet-resonance technique for extracting the dielectric constant of laminate materials used for printed-circuit-board wiring are presented over the frequency range 0.250 GHz to 2.2 GHz. It is shown that skin-effect and surface roughness introduce significant errors as materials become thinner than 10 mil. These effects result in over-prediction of /spl epsiv//sub r/´ and prevent determination of the /spl epsiv//sub r/´(f) variation.

Keywords

laminates; measurement errors; permittivity measurement; printed circuit testing; resonance; skin effect; surface topography; 0.250 to 2.2 GHz; 10 mil; accuracy limitations; complex permittivity; dielectric constant measurement accuracy; frequency range; full-sheet-resonance technique IPC-TM-650 2.5.5.6; laminate materials; printed-circuit-board wiring; skin-effect errors; surface roughness errors; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency; Optical propagation; Permittivity; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on

Conference_Location

Monterey, CA, USA

Print_ISBN

0-7803-7451-7

Type

conf

DOI

10.1109/EPEP.2002.1057939

Filename

1057939