Title :
Measurement of milliohms of impedance at hundred MHz on chip power supply loop
Author :
Kantorovich, I. ; Houghton, C. ; St Laurent, J.
Author_Institution :
Hewlett-Packard Co., Shrewsbury, MA, USA
Abstract :
The introduced method of measuring the high frequency impedance of a microprocessor´s power supply loop is based on measurement of the on-chip voltage generated by a predetermined stimulus formed by a set of computer instructions.
Keywords :
SPICE; circuit simulation; electric impedance measurement; integrated circuit measurement; integrated circuit modelling; microprocessor chips; voltage measurement; Spice simulations; computer instruction generated stimuli; microprocessor power supply loop high frequency impedance measurement; milliohm range impedance measurement; on-chip power supply loop HF impedance measurement; predetermined stimulus generated on-chip voltage measurement; Computer aided instruction; Current measurement; Frequency measurement; Impedance measurement; Packaging; Power generation; Power measurement; Power supplies; Semiconductor device measurement; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057941
