DocumentCode
2506796
Title
Solder joint grain boundary structure and diffusivity via molecular dynamics simulations
Author
Basaran, Cemal ; Sellers, Michael S. ; Schultz, Andrew J. ; Kofke, David A. ; Lee, Yongchang
Author_Institution
Dept. of Civil, Struct. & Environ. Eng., Univ. at Buffalo, The State Univ. of New York, Buffalo, NY, USA
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
514
Lastpage
517
Abstract
We investigate the effect of various amounts of Ag and Cu solute atoms on the self-diffusivity of Sn in the (101) symmetric tilt βSn grain boundary. Using molecular dynamics (MD) simulations over a temperature range of 300K to 450K, we show that both Ag and Cu decrease the grain boundary self-diffusivity of Sn, as the amount of solute in the interface increases. Additionally, the presence of Ag at the grain boundary interface causes a greater reduction in the self-diffusivity of Sn when compared to Cu. We also analyze the solute effect on the diffusive width of the interface and find that low concentrations of both Ag and Cu shrink the width relative to the pure βSn interface.
Keywords
copper alloys; grain boundary diffusion; molecular dynamics method; silver alloys; solders; tin alloys; MD simulations; SnAgCu; grain boundary self-diffusivity; molecular dynamic simulations; solder joint grain boundary structure; symmetric tilt grain boundary; temperature 300 K to 450 K; Atomic measurements; Computational modeling; Grain boundaries; Mathematical model; Temperature measurement; Tin; Molecular dynamics; diffusivity; grain boundary diffusivity; lead-free solder alloy; solute;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231473
Filename
6231473
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