Title :
Requirements for holonic manufacturing systems control
Author :
Balasubramanian, S. ; Brennan, R.W. ; Norrie, D.H.
Author_Institution :
Dept. of Mech. & Manuf. Eng., Calgary Univ., Alta., Canada
Abstract :
Real time control of holonic manufacturing systems requires a radically different approach from that of traditional unit level regulatory control. Because they need to automatically adapt and reconfigure based on the ever changing requirements of the manufacturing system, control systems based on this approach are termed metamorphic control systems. The engineering of such software centric metamorphic control systems for dynamically reconfigurable distributed multi sensor based holonic systems is addressed. An integrated and uniform event driven control architecture is specified for various functional levels of metamorphic control system. This architecture utilizes the emerging International Electrotechnical Commission function block standard (IEC 1499) for industrial process measurement and control systems to specify the requisite behavior of distributed control software components (agents)
Keywords :
IEC standards; manufacturing data processing; object-oriented programming; process control; real-time systems; systems analysis; IEC 1499; International Electrotechnical Commission function block standard; distributed control software components; dynamically reconfigurable distributed multi sensor based holonic systems; functional levels; holonic manufacturing systems control; industrial process measurement; real time control; requisite behavior; software centric metamorphic control systems; uniform event driven control architecture; unit level regulatory control; Automatic control; Computer architecture; Control systems; IEC standards; Manufacturing systems; Measurement standards; Real time systems; Sensor systems; Software standards; Systems engineering and theory;
Conference_Titel :
Database and Expert Systems Applications, 2000. Proceedings. 11th International Workshop on
Conference_Location :
London
Print_ISBN :
0-7695-0680-1
DOI :
10.1109/DEXA.2000.875029