Title :
Wavelet Based RDNN for Software Reliability Estimation
Author :
Smiarowski, Adam, Jr. ; Abdel-Aty-Zohdy, Hoda S. ; Sherif, Mostafa Hashem ; Shah, Hemal
Author_Institution :
Oakland University, USA
Abstract :
Using the wavelet basis in Recurrent Dynamic Neural Network (RDNN) can improve the failure event estimation of software defect tracking in telecommunications. Non-linearity of the system is represented by proper selection of the wavelet function. This RDNN handles noisy data and enhances the speed of convergence as compared with alternate approaches. A new adaptive RDNN is presented where software deployment testing observations are used to synthesize intrinsic model parameters.
Keywords :
Application software; Convergence; Equations; Microelectronics; Neural networks; Neurons; Nonlinear dynamical systems; Recurrent neural networks; Software reliability; Testing;
Conference_Titel :
Computers and Communications, 2006. ISCC '06. Proceedings. 11th IEEE Symposium on
Print_ISBN :
0-7695-2588-1
DOI :
10.1109/ISCC.2006.168