Title :
Characterization of Sn2.4Ag solder viscoplastic behavior under cyclic loading
Author :
Yang, H.-C. ; Chiu, T.-C.
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
May 30 2012-June 1 2012
Abstract :
A series of monotonic and cyclic experiments, including constant strain-rate, creep and cyclic loading tests at isothermal temperatures between 25°C and 150°C, were performed to characterize the viscoplastic behavior of Pb-free Sn2.4Ag solder. The constitutive model of the solder was developed by fitting the monotonic test results to the Anand viscoplastic model. Finite element model based on the Anand constitutive model was then applied to simulate solder responses under various cyclic loading histories, and compared to the experimental results. From the comparison it was observed that the Anand model reproduces the isotropic hardening behavior of the Sn2.4Ag solder; but as a result of lacking tensorial state variable, the model could not capture the kinematic hardening response under load reversal. Nevertheless, the thermal recovery behavior of the Sn2.4Ag solder is limited under cyclic creep loading, and the Anand model is still suitable for predicting the Sn2.4Ag solder response under low-stress cyclic loading conditions.
Keywords :
creep testing; electronics packaging; finite element analysis; hardening; silver alloys; solders; tin alloys; viscoplasticity; Anand constitutive model; Anand viscoplastic model; SnAg; constant strain-rate; cyclic creep loading; cyclic loading tests; finite element model; isothermal temperatures; isotropic hardening behavior; kinematic hardening response; load reversal; low-stress cyclic loading conditions; monotonic test; solder response simulation; solder viscoplastic behavior characterization; temperature 25 degC to 150 degC; tensorial state variable; the thermal recovery behavior; Abstracts; Facsimile; Lead; Load modeling; Anand model; cyclic; lead-free; viscoplastic;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231517