DocumentCode
2507708
Title
Maximum entropy fracture model and fatigue fracture of mixed SnPb/Sn3.0Ag0.5Cu solder alloys
Author
Tucker, J.P. ; Chan, D.K. ; Subbarayan, G. ; Handwerker, C.A.
Author_Institution
Purdue Univ., West Lafayette, IN, USA
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
870
Lastpage
879
Abstract
During the transition from Pb-containing solders to Pb-free solders, joints composed of a mixture of SnPb and SnAgCu often result from either mixed assemblies or rework. Comprehensive characterization of the constitutive and fatigue fracture behavior of these mixed solder alloys is necessary to predict the life of mixed alloy solder joints. Three alloys of 1, 5 and 20 weight percent Pb were selected so as to represent reasonable ranges of Pb contamination expected from different 63Sn37Pb components mixed with Sn3.0Ag0.5Cu alloy. In recent, related, work we developed constitutive relations for these alloys; this work focuses on the fatigue failure behavior. One recent approach to modeling fatigue fracture in ductile solids is the maximum entropy fracture model. The maximum entropy fracture model is a thermodynamically consistent and information theory inspired (non-empirical) damage accumulation theory for ductile solids, validated on both area array and peripheral array packages. The model uses a single damage accumulation parameter to relate the probability of fracture to accumulated entropic dissipation. A custom-built microscale mechanical tester capable of submicron displacement resolution was utilized to carryout isothermal cyclic fatigue tests on specially designed assemblies using the three mixed alloys. The resultant relationship between load drop and accumulated entropic dissipation was used to extract the temperature and geometry-independent damage accumulation parameter of the information theoretic model for each alloy. Combining our knowledge of the constitutive behavior with the damage accumulation behavior, life predictions can be made for a wide variety of package types and mixed metallurgical conditions.
Keywords
contamination; copper alloys; ductile fracture; electronics packaging; entropy; failure analysis; fatigue testing; lead alloys; probability; silver alloys; solders; tin alloys; SnPb-SnAgCu; accumulated entropic dissipation; contamination; damage accumulation theory; ductile solids; fatigue failure behavior; fatigue fracture modelling; fracture probability; geometry-independent damage accumulation parameter; information theoretic model; information theory; isothermal cyclic fatigue tests; life predictions; maximum entropy fracture model; microscale mechanical tester; mixed assembly; mixed metallurgical conditions; mixed solder alloys; peripheral array packages; single damage accumulation parameter; submicron displacement resolution; temperature extraction; Creep; Fatigue; Lead; Microstructure; Strain; Stress; Anand model; SnAgCu solder; SnPb solder; constitutive behavior; damage; fatigue fracture; maximum entropy fracture model;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231518
Filename
6231518
Link To Document