• DocumentCode
    2507835
  • Title

    Manufacturing concerns of the electronic industry regarding intermetallic compound formation during the soldering stage

  • Author

    Blair, Howard D. ; Pan, Tsung-Yu ; Nicholson, John M. ; Cooper, Ronald P. ; Oh, Sung-Won ; Farah, Ahmad R.

  • Author_Institution
    Ford Motor Co., Dearborn, MI, USA
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    282
  • Lastpage
    292
  • Abstract
    The intermetallic compound (IMC) formed at the interface between the solder and substrate is an inevitable result of the soldering process. It is an indication of good metallurgical bonding. But if it grows too thick, either during soldering or subsequent solid stage aging, it can have a deleterious effect on the strength of a joint or on the subsequent solderability of a component. Most of the literature studies have concentrated on the IMC growth during the solid stage aging. A few papers addressed the IMC formation during the molten stage, but most of these studies were in a temperature and time domain not applicable to the manufacturing soldering process. In this study, we examined the growth mechanism of the Cu6Sn5 IMC in the molten stage between 100Sn, 96.5Sn-3.5Ag, and 63Sn-37Pb solders on electroplated copper, which mimics the printed-wiring boards, and on rolled OFHC copper sheet, which simulates the component leads and electrical connectors
  • Keywords
    chemical interdiffusion; electron device manufacture; soldering; Cu-Sn; Cu-SnAg; Cu-SnPb; Cu6Sn5; component lead; electrical connector; electronic industry; electroplated copper; intermetallic compound formation; manufacturing; metallurgical bonding; printed-wiring board; rolled OFHC copper sheet; soldering; Aging; Bonding; Copper; Electronics industry; Intermetallic; Manufacturing processes; Pulp manufacturing; Soldering; Solids; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559744
  • Filename
    559744