DocumentCode :
2508078
Title :
Mechanical deformation behavior of SAC305 at high strain rates
Author :
Lall, Pradeep ; Shantaram, Sandeep ; Suhling, Jeff ; Locker, David
Author_Institution :
Dept. of Mech. Eng., Auburn Univ., Auburn, AL, USA
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
1037
Lastpage :
1051
Abstract :
Electronic products are subjected to high G-levels during mechanical shock and vibration. Failure-modes include solder-joint failures, pad cratering, chip-cracking, copper trace fracture, and underfill fillet failures. The second-level interconnects may be experience high-strain rates and accrue damage during repetitive exposure to mechanical shock. Industry migration to lead free solders has resulted in proliferation of a wide variety of solder alloy compositions. One of the popular tin-silver-copper alloys is Sn3Ag0.5Cu. The high strain rate properties of lead free solder alloys are scarce. Typical material tests systems are not well suited for measurement of high strain rates typical of mechanical shock. Previously, high strain rates techniques such as the Split Hopkinson Pressure Bar (SHPB) can be used for strain rates of 1000 per sec. However, measurement of materials at strain rates of 1-100 per sec which are typical of mechanical shock is difficult to address. In this paper, a new test-technique developed by the authors has been presented for measurement of material constitutive behavior. The instrument enables attaining strain rates in the neighborhood of 1 to 100 per sec. High speed cameras operating at 300,000 fps have been used in conjunction with digital image correlation for the measurement of full-field strain during the test. Constancy of cross-head velocity has been demonstrated during the test from the unloaded state to the specimen failure. Solder alloy constitutive behavior has been measured for SAC305 solder. Constitutive model has been fit to the material data. Samples have been tested at various time under thermal aging at 25°C and 125°C. The constitutive model has been embedded into an explicit finite element framework for the purpose of life-prediction of lead free interconnects. Test assemblies has been fabricated and tested under JEDEC JESD22-B111 specified condition for mechanical shock. Model predictions have been correla- ed with experimental data.
Keywords :
ageing; cameras; copper alloys; deformation; electronic products; electronics packaging; failure analysis; finite element analysis; interconnections; silver alloys; solders; strain measurement; tin alloys; vibrations; JEDEC JESD22-B111 specified condition; SAC305 solder; SHPB; SnAgCu; cross-head velocity constancy; digital image correlation; electronic products; explicit finite element framework; failure-modes; full-field strain measurement; high G-levels; high speed cameras; high strain rate property; high strain rate techniques; lead free interconnects; lead free solder alloys; life-prediction; material constitutive behavior measurement; material tests systems; mechanical deformation behavior; mechanical shock; pad cratering; second-level interconnects; solder alloy compositions; solder-joint failures; split Hopkinson pressure bar; temperature 125 degC; temperature 25 degC; test assembly; thermal aging; underfill fillet failures; vibration; Aging; Electric shock; Materials; Metals; Strain; Strain measurement; Temperature measurement; High Strain Rate; Leadfree; SnAgCu; Solder;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231539
Filename :
6231539
Link To Document :
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