• DocumentCode
    2508117
  • Title

    Force measurement with pico-Newton order resolution using a carbon nanotube probe

  • Author

    Arai, Fumihito ; Nakajima, Masahiro ; Dong, Lixin ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro Syst., Nagoya Univ., Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    105
  • Lastpage
    110
  • Abstract
    Force measurement with pico-Newton (pN) order resolution is presented by using a carbon nanotube (CNT) probe. Based on the theoretical analysis, a CNT is suitable for the sensitive force measurement. A CNT probe is constructed by attaching a CNT to the tip of an atomic force microscope (AFM) cantilever, by the electron-beam-induced deposition (EBID) though the nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). In order to attach a CNT quickly and correctly, CNTs are dispersed in ethanol by ultrasonic waves for several hours and oriented by electrophoresis. We measured pico-Newton order contact forces with a CNT probe, which is constructed with nanorobotic manipulators, by measuring deformation of a CNT probe from FE-SEM images.
  • Keywords
    carbon nanotubes; electron beam deposition; field emission electron microscopy; force measurement; microrobots; probes; atomic force microscope cantilever; carbon nanotube probe; electron-beam-induced deposition; electrophoresis; field-emission scanning electron microscope; nanorobotic manipulators; pico-Newton order resolution; sensitive force measurement; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Carbon nanotubes; Ethanol; Force measurement; Joining processes; Probes; Scanning electron microscopy; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micromechatronics and Human Science, 2002. MHS 2002. Proceedings of 2002 International Symposium on
  • Print_ISBN
    0-7803-7611-0
  • Type

    conf

  • DOI
    10.1109/MHS.2002.1058019
  • Filename
    1058019