• DocumentCode
    2508137
  • Title

    Novel high-precision micropipette thermal sensor for materials thermal characterizations

  • Author

    Lee, K.M. ; Shrestha, R. ; Ghanta, D. ; Cross, E. ; Londono, M. ; Dangol, A. ; Choi, T.-Y.

  • Author_Institution
    Dept. of Mech. & Energy Eng., Univ. of North Texas, Denton, TX, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    1065
  • Lastpage
    1069
  • Abstract
    A novel technique for fabricating high-resolution micropipette thermal sensors using inexpensive materials was developed. The technique can be implemented relatively easily in a laboratory setting. The micropipette sensors were constructed by filling a metal inside a glass micropipette and coating a thin film on the outer surface of a glass micropipette by PVD (Physical Vapor Deposition), so that thermocouple junctions were created at the tips of the micropipettes. The outsides of the pipettes were covered with vaporized Ni (nickel) onto a Sn (tin) based solder layer. The goal is to maintain a consistent Seebeck coefficient relationship after repeated measurements. A crystalline Si (silicon) [111] wafer was selected for testing and its thermal conductivity was found to be 155 W/m°C. This was well fitted to its known value. After confirming its reliability, FLG (a few layer graphene) was characterized for its thermal conductivity by the sensor. The thermal conductivity of the FLG was measured to 1682.52 W/ m°C.
  • Keywords
    glass; microsensors; thermal conductivity; thermocouples; vapour deposition; FLG; PVD; crystalline Si wafer; few layer graphene; glass micropipette; high-precision micropipette thermal sensor; materials thermal characterizations; physical vapor deposition; reliability; thermal conductivity; thermocouple junctions; thin film; Measurement by laser beam; Silicon; Temperature measurement; Thermal conductivity; Thermal sensors; Thickness measurement; graphene; micropipette thermal sensor; thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231542
  • Filename
    6231542