• DocumentCode
    2508291
  • Title

    Numerical analysis of spreaders with an enhancing nucleate boiling surface for immersion cooling of chips with central hot spots

  • Author

    Ali, Amir F. ; El-Genk, Mohamed S.

  • Author_Institution
    Inst. for Space & Nucl. Power Studies, Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    1106
  • Lastpage
    1113
  • Abstract
    Presented are the results of numerical thermal analysis of composite and plane cu spreaders for immersion cooling of an underlying 10 × 10 mm chip with a 1 × 1 mm or 2 × 2 mm CHS. The composite spreaders are comprised of a 1.6 - 3.2 mm thick cu substrate and an 80-μm thick MPC surface. The analysis varied the heat flux at CHS from 2 - 6 times the chip´s surface average outside the hot spot. Saturation nucleate boiling of PF-5060 dielectric liquid cools the surface of the spreader. Results demonstrated the effectiveness of the composite spreaders for mitigating the effect of the CHS by decreasing the chip maximum surface temperature and increasing the thermal power removed. Increasing the area and heat flux of CHS and decreasing the thickness of the cu substrate decrease the thermal power removed and the spreader footprint area. However, they increase the total thermal resistance of the spreader and the chip maximum surface temperature.
  • Keywords
    boiling; cooling; dielectric liquids; integrated circuit packaging; numerical analysis; thermal resistance; CHS heat flux; Cu; MPC surface; PF-5060 dielectric liquid; central hotspots; chip immersion cooling; chip maximum surface temperature; chip surface; composite spreader numerical thermal analysis; nucleate boiling surface; plane copper spreader numerical analysis; size 1.6 nm to 3.2 nm; size 80 mum; spreader footprint area; thermal power; total thermal resistance; Heating; Ocean temperature; Sea surface; Substrates; Surface impedance; Surface resistance; Thermal resistance; chips; composite spreader; hot spots; immersion cooling; micro-porous copper; nucleate boiling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231547
  • Filename
    6231547