DocumentCode
2508291
Title
Numerical analysis of spreaders with an enhancing nucleate boiling surface for immersion cooling of chips with central hot spots
Author
Ali, Amir F. ; El-Genk, Mohamed S.
Author_Institution
Inst. for Space & Nucl. Power Studies, Univ. of New Mexico, Albuquerque, NM, USA
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
1106
Lastpage
1113
Abstract
Presented are the results of numerical thermal analysis of composite and plane cu spreaders for immersion cooling of an underlying 10 × 10 mm chip with a 1 × 1 mm or 2 × 2 mm CHS. The composite spreaders are comprised of a 1.6 - 3.2 mm thick cu substrate and an 80-μm thick MPC surface. The analysis varied the heat flux at CHS from 2 - 6 times the chip´s surface average outside the hot spot. Saturation nucleate boiling of PF-5060 dielectric liquid cools the surface of the spreader. Results demonstrated the effectiveness of the composite spreaders for mitigating the effect of the CHS by decreasing the chip maximum surface temperature and increasing the thermal power removed. Increasing the area and heat flux of CHS and decreasing the thickness of the cu substrate decrease the thermal power removed and the spreader footprint area. However, they increase the total thermal resistance of the spreader and the chip maximum surface temperature.
Keywords
boiling; cooling; dielectric liquids; integrated circuit packaging; numerical analysis; thermal resistance; CHS heat flux; Cu; MPC surface; PF-5060 dielectric liquid; central hotspots; chip immersion cooling; chip maximum surface temperature; chip surface; composite spreader numerical thermal analysis; nucleate boiling surface; plane copper spreader numerical analysis; size 1.6 nm to 3.2 nm; size 80 mum; spreader footprint area; thermal power; total thermal resistance; Heating; Ocean temperature; Sea surface; Substrates; Surface impedance; Surface resistance; Thermal resistance; chips; composite spreader; hot spots; immersion cooling; micro-porous copper; nucleate boiling;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231547
Filename
6231547
Link To Document