DocumentCode
2508609
Title
Solder-bonded carbon nanotube thermal interface materials
Author
Barako, Michael T. ; Gao, Yuan ; Marconnet, Amy M. ; Asheghi, Mehdi ; Goodson, Kenneth E.
Author_Institution
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
fYear
2012
fDate
May 30 2012-June 1 2012
Firstpage
1225
Lastpage
1233
Abstract
Vertically-aligned carbon nanotube (CNT) films offer an attractive combination of properties for thermal interface applications, specifically high thermal conductance and mechanical compliance. In this work, we examine the use of a solder bonding layer to attach and transfer CNT films from the silicon growth substrate onto metalized surfaces. Indium foil is considered as a bonding layer for low-temperature (<;150°C) applications while a tin-plated aluminum/nickel foil is used for high temperature applications (<;1000°C). The intrinsic thermal conductivity of the CNT film and the thermal boundary resistances between the CNT film and the surrounding materials are measured with comparative infrared microscopy before and after solder bonding. The thermal properties are measured over a range of applied compressive stress. In general, compressive stress reduces the thermal boundary resistance and improves the thermal conductivity of the CNT films. Solder bonding of the exposed (non-growth) interface reduces the thermal boundary resistance by up to a factor of 30 over a dry unbonded contact.
Keywords
aluminium alloys; bonding processes; carbon nanotubes; nickel alloys; solders; thermal conductivity; thermal resistance; thin films; tin alloys; C; Si; SnAlNi; applied compressive stress; dry unbonded contact; indium foil; infrared microscopy; intrinsic thermal conductivity; mechanical compliance; metalized surfaces; silicon growth substrate; solder bonding layer; solder-bonded carbon nanotube; thermal boundary resistance; thermal conductance; thermal interface materials; thermal properties; tin-plated aluminum-nickel foil; transfer CNT films; vertically-aligned carbon nanotube film; Bonding; Films; Indium; Substrates; Temperature measurement; Thermal conductivity; Thermal resistance; Nanofoil; indium bonding; infrared thermometry; thermal interface;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location
San Diego, CA
ISSN
1087-9870
Print_ISBN
978-1-4244-9533-7
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2012.6231562
Filename
6231562
Link To Document