Title :
High level design validation: current practices and future directions
Author :
Ghosh, Indradeep ; Prasad, Mukul ; Mukherjee, Rajarshi ; Fujita, Masahiro
Author_Institution :
Fujitsu Labs. of America, Inc., Sunnyvale, CA, USA
Abstract :
This paper describes about the increasing complexity of VLSI design, time to market pressures. The two major paradigms to address the difficulties currently being faced by industry are: (1) the use of higher levels of design abstraction and (2) efficient and seamless design reuse. Current industrial practices and academic research in design verification and validation are also discussed.
Keywords :
VLSI; formal verification; integrated circuit design; integrated circuit modelling; specification languages; VLSI design; design reuse; high level design abstraction; high level design validation; Automatic test pattern generation; Automatic testing; Design engineering; Electronics industry; Hardware design languages; Industrial electronics; Laboratories; Time to market; Unified modeling language; Very large scale integration;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1260892
