• DocumentCode
    2508637
  • Title

    Enhanced centrifugal percolating thermal underfills based on neck formation by capillary bridging

  • Author

    Goicochea, Javier V. ; Brunschwiler, Thomas ; Zürcher, Jonas ; Wolf, Heiko ; Matsumoto, Keiji ; Michel, Bruno

  • Author_Institution
    IBM Res. - Zurich, Rüschlikon, Switzerland
  • fYear
    2012
  • fDate
    May 30 2012-June 1 2012
  • Firstpage
    1234
  • Lastpage
    1241
  • Abstract
    We present a methodology for the formulation of percolating thermal underfills (PTUFs) with enhanced thermal conductivity for efficient heat dissipation between dies in 3D chip stacks. The methodology is based on the centrifugal filling of micron-sized powders in a confined space (defined by a solder ball array) to form a percolating particle bed, and on the formation of enhanced thermal contacts between particles and contacting surfaces, through the directed self-assembly of nanoparticles around the contacts (i.e. neck formation). The resulting composite material is characterized in terms of the fill fraction and its corresponding thermal conductivity with and without the formation of enhanced particle contacts. For underfills (UFs) formulated without enhanced contacts and using boron nitride, graphite or diamond powders, we have found thermal conductivity values ranging from 1.8 to 2.5 ± 0.1 W/m-K. The formation of enhanced particle contacts using silver nanoparticles dispensed in a 4.8 vol% suspension further increases the thermal conductivity to 3.8 ± 0.3 W/m-K; representing an increase of nearly one order of magnitude compared to silica laden capillary underfills (i.e. ~ 0.4 W/m-K). The thermal conductivity of all samples was measured using our in-home thermal conductivity tester. The increase in the thermal conductivity is related to thermal percolation resulting from the very high volumetric fill fractions (i.e. >; 60 vol%) reached with the proposed approach and to the reduction in the thermal resistance at contact locations by the silver necks. Furthermore, the present methodology is relatively insensitive to the shape and size of particles used, offering a great flexibility in material selection and quality (not acceptable for capillary-based underfills); and could enable efficient heat removal in future 3D chip stacks, flip-chip on board assemblies for mobile applications.
  • Keywords
    cooling; electrical contacts; flip-chip devices; integrated circuit packaging; nanoparticles; percolation; self-assembly; silver; thermal conductivity; three-dimensional integrated circuits; 3D chip stacks; PTUF; capillary bridging; composite material; confined space; contacting surfaces; diamond powders; directed self-assembly; efficient heat dissipation; enhanced centrifugal percolating thermal underfills; enhanced particle contacts; enhanced thermal conductivity; enhanced thermal contacts; flip-chip on board assembly; graphite; high volumetric fill fractions; home thermal conductivity tester; micron-sized powders; neck formation; percolating particle bed; silica laden capillary underfills; silver nanoparticles; Cavity resonators; Conductivity; Filling; Neck; Silicon compounds; Thermal conductivity; Thermal resistance; 3D chip stacks; capillary bridging; directed self-assembly; necking; particles; percolation; thermal conductivity; underfill;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-9533-7
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2012.6231563
  • Filename
    6231563