DocumentCode
2508638
Title
The Research on Software Test Pattern
Author
Yi-chen, Wang ; Yi-kun, Wang
Author_Institution
Dept. of Project Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear
2011
fDate
18-19 June 2011
Firstpage
109
Lastpage
113
Abstract
The purpose to introduce PATTERN into software test area is to solve the problem of repeatedly tested software and to diminish the uncertainty problem in software test, so that the efficiency and quality of software test will be improved. This paper will introduce the concept and the method of software test pattern; address the pattern system of software test. The basic parts of pattern research, including the requirement of pattern system, pattern types in three dimensional space, evolution of pattern system and how the pattern system supports software test will be discussed in detail. The ending part is the summary of the paper.
Keywords
program testing; software quality; software test area; software test pattern; software test quality; Buildings; Presses; Runtime; Software design; Three dimensional displays; Uncertainty; pattern; pattern system; software test; software test pattern; test system;
fLanguage
English
Publisher
ieee
Conference_Titel
Future Computer Sciences and Application (ICFCSA), 2011 International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4577-0317-1
Type
conf
DOI
10.1109/ICFCSA.2011.32
Filename
5968038
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