DocumentCode
2508689
Title
Experimental investigation of a metalized-film attenuator for validation of terahertz time-domain spectroscopy
Author
Iida, Hitoshi ; Kinoshita, Moto ; Shimada, Yozo ; Kuroda, Hideki ; Kitagishi, Keiko ; Izutani, Yusuke
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear
2012
fDate
23-28 Sept. 2012
Firstpage
1
Lastpage
2
Abstract
We have experimentally investigated the terahertz (THz) transmission properties of metalized-film attenuators (MFAs) with base film thicknesses of 6 μm and 25 μm. Transmittance of the MFAs was measured by a THz time-domain spectrometer. Good flatness and repeatability of the transmittance were verified for the 6 μm-thick MFA in the frequency range up to 3 THz.
Keywords
attenuators; metallic thin films; terahertz wave spectra; thin film devices; film thicknesses; frequency 3 THz; metalized-film attenuator; size 25 mum; size 6 mum; terahertz time-domain spectra; transmission properties; transmittance flatness; transmittance repeatability; Antenna measurements; Attenuators; Films; Frequency measurement; Laser excitation; Measurement by laser beam; Metals;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location
Wollongong, NSW
ISSN
2162-2027
Print_ISBN
978-1-4673-1598-2
Electronic_ISBN
2162-2027
Type
conf
DOI
10.1109/IRMMW-THz.2012.6380185
Filename
6380185
Link To Document