Title :
Characterizing junction-to-case thermal resistance and its impact on end-use applications
Author :
Galloway, Jesse E. ; Bhopte, Siddharth ; Nelson, Cameron
Author_Institution :
Amkor Technol., Chandler, AZ, USA
fDate :
May 30 2012-June 1 2012
Abstract :
High power packages require a low junction-to-case thermal resistance (Theta jc) to achieve target junction temperatures. Theta jc is a metric used to compare package-to-package relative thermal performance. It is also used in two-resistor models to predict thermal performance under system level conditions. This study shows that the commonly used Theta jc definition does not correctly track package junction temperatures in actual end-use applications nor does it serve as a reliable metric for comparing package-to-package performance. When spreading resistance in the lid is taken into account, the modified Theta jc definition overcomes some of the shortfalls found with the standard Theta jc calculation. Lastly, a simplified thermal interface resistance model is presented as a more accurate alternative to the one resistor Theta jc and the multi-resistor Delphi models.
Keywords :
electronics packaging; resistors; thermal resistance; Theta jc definition; high power packages; junction-to-case thermal resistance; junction-to-case thermal resistance characterization; multiresistor Delphi models; package junction temperatures; package-to-package relative thermal performance; simplified thermal interface resistance model; spreading resistance; target junction temperatures; two-resistor models; Cold plates; Copper; Heat sinks; Heating; Junctions; Resistance; Temperature measurement; FEA; TIM; Theta jc; experimental;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231576