DocumentCode

2508957

Title

Magnetorestive Sensitivity Mapping at the Wafer Level with a Scanning Probe Microscope

Author

Louder, D.R. ; Ryan, P.J. ; Schultz, Arturo E.

Author_Institution

Seagate Technology

fYear

1998

fDate

6-9 Jan. 1998

Firstpage

248

Lastpage

248

Keywords

Hard disks; Image resolution; Image sensors; Magnetic force microscopy; Magnetic forces; Magnetic heads; Magnetic sensors; Magnetoresistance; Probes; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

MMM-Intermag Conference, 1998. Abstracts., The 7th Joint

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-5118-5

Type

conf

DOI

10.1109/INTMAG.1998.742310

Filename

742310