Title :
Calibration methodology for interposing liquid coolants for infrared thermography of microprocessors
Author :
Hom, Lewis ; Durieux, Antoine ; Miler, Josef ; Asheghi, Mehdi ; Ramani, Karthik ; Goodson, Kenneth E.
Author_Institution :
Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
fDate :
May 30 2012-June 1 2012
Abstract :
There have been unprecedented temperature non-uniformities reported in conventional 2D- and emerging 3D-packaged multi-core microprocessors. Therefore, techniques for spatially resolving chip power and temperature profiles in fully operational chips are needed to improve circuit design and enable optimal cooling solutions. This paper presents a high-resolution, infrared (IR) thermography technique for microprocessors operating at fully-operational power levels. A custom, microfluidic heat sink with an IR-transparent working fluid (0.75 LPM) is manufactured to cool an instrumented test chip while permitting optical access for IR thermal imaging. A detailed system calibration is conducted to account for the temperature-dependent optical properties of the chip and heat sink. It is concluded that the IR imaging can be conducted with ~ 0.1 °C error over the temperature range of 45-90 °C if the fluid plenum height is less than 500 μm. For a 2 mm channel, the error can be as high as 43°C due to strong signal attenuation in the fluid.
Keywords :
calibration; cooling; heat sinks; infrared imaging; integrated circuit design; integrated circuit packaging; microfluidics; microprocessor chips; multiprocessing systems; three-dimensional integrated circuits; 2D-packaged multicore microprocessors; 3D-packaged multicore microprocessors; IR thermal imaging; IR thermography technique; IR-transparent working fluid; calibration methodology; circuit design; fluid plenum; high-resolution infrared thermography technique; infrared thermography; instrumented test chip cooling; interposing liquid coolants; microfluidic heat sink; optimal cooling solutions; signal attenuation; spatially resolving chip power; temperature 45 degC to 90 degC; temperature profiles; temperature-dependent optical properties; unprecedented temperature nonuniformity; Calibration; Heat sinks; Heating; Liquids; Optical attenuators; Temperature; Temperature measurement; Heat sink; Infrared Imaging; Liquid Cooling; Microprocessor Thermal Management;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2012.6231585