Title :
Potential Data Loss Due to Head/Disk Contacts During Dynamic Load/Unload
Author :
Suk, M. ; Jen, David
Author_Institution :
IBM Corp.
Keywords :
Actuators; Atomic force microscopy; Cascading style sheets; Magnetic force microscopy; Magnetic heads; Magnetic losses; Magnetic separation; Magnetoelasticity; Magnetostriction; Testing;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742320