DocumentCode
2509271
Title
Measurement of the dielectric constant of medium loss cylindrical-shaped samples using cavity perturbation method
Author
Banerjee, Prithu ; Ghosh, Gautam ; Biswas, Salil Kumar
Author_Institution
Dept. of Phys., Univ. of Sci., Kolkata
fYear
2008
fDate
21-24 Nov. 2008
Firstpage
124
Lastpage
125
Abstract
In this paper an analytical formula for the measurement of the dielectric constant of materials having cylindrical shape is derived using cavity perturbation method. The formula is established using two known samples Teflon and Perspex at X-band frequencies and the results are compared with those obtained for rectangular samples.
Keywords
dielectric materials; permittivity; perturbation theory; polymers; shapes (structures); Perspex; Teflon; X-band frequencies; cavity perturbation method; cylindrical shape; dielectric constant; Cavity perturbation methods; Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Erbium; Frequency; Loss measurement; Microwave measurements; Shape measurement; Dielectric constant; cylindrical-shaped sample; microwave frequencies; perturbation; rectangular cavity;
fLanguage
English
Publisher
ieee
Conference_Titel
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location
Jaipur
Print_ISBN
978-1-4244-2690-4
Electronic_ISBN
978-1-4244-2691-1
Type
conf
DOI
10.1109/AMTA.2008.4762975
Filename
4762975
Link To Document